A Systematic Material Characterization Method via Near-Field Scanning Microwave Microscopy-Reference-Cited by-同舟云学术

A Systematic Material Characterization Method via Near-Field Scanning Microwave Microscopy

Published:2022-06 Issue:6 Volume:70 Page:3300-3309
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Zhou Yulong¹^ORCID,Leng Ning²^ORCID,Wei Zhun³^ORCID,Ye Xiuzhu⁴^ORCID,Bai Ming²^ORCID,Chen Xudong¹^ORCID

Affiliation:

1. Department of Electrical and Computer Engineering, National University of Singapore, Singapore

2. School of Electronic and Information Engineering, Beihang University, Beijing, China

3. College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China

4. School of Information and Electronics Engineering, Beijing Institute of Technology, Beijing, China

Funder

Singapore Ministry of Education

National Natural Science Foundation of China

Fund of Key Laboratory for Information Science of Electromagnetic Waves

Beijing Institute of Technology Research Fund Program for Young Scholars

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx7/22/9788475/09751229.pdf?arnumber=9751229

Reference36 articles.

1. Computational Methods for Electromagnetic Inverse Scattering

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3. The Distribution Measurement of the Photo-induced Plasma in Semiconductor by Near-field Scanning Microwave Microscopy

4. A Nonlinear Conjugate Gradient Method with a Strong Global Convergence Property

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