Transient ionizing radiation effects in devices and circuits
Author:
Affiliation:
1. Inst. for Space & Defense Electron., Vanderbilt Univ., Nashville, TN, USA
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Link
http://xplorestaging.ieee.org/ielx5/23/27200/01208577.pdf?arnumber=1208577
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