Transient Dose Rate Effect Between System-in-Package and Printed Circuit Boards: A Comparative Experimental Study-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Transient Dose Rate Effect Between System-in-Package and Printed Circuit Boards: A Comparative Experimental Study

Published:2023-08 Issue:8 Volume:70 Page:2106-2115
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Li Yang¹^ORCID,Guo Yaxin¹^ORCID,Li Junlin²,He Chaohui¹,Peng Zhigang¹,Liu Jiaxin¹,Li Ruibin²,Zhao Hongchao³,Chen Wei²^ORCID,Li Yonghong¹,Li Pei¹^ORCID,Xiong Cen³

Affiliation:

1. School of Nuclear Science and Technology, Xi’an Jiaotong University, Xi’an, China

2. State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi’an, China

3. Institute of Electronic Engineering, China Academy of Engineering Physics, Mianyang, China

Funder

National Natural Science Foundation of China

China Scholarship Council

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx7/23/10221197/10182301.pdf?arnumber=10182301

Reference34 articles.

1. Transient ionizing radiation effects in devices and circuits

2. Study on the transient ionization radiation damage pattern of 0.18 ?m SRAM;junlin;Proc Int Conf Radiat Effects Electron Devices (ICREED),2018

3. A Modified Steady-State Method for Space Charge-Limited Effect of SGEMP

4. Investigation on Transient Ionizing Radiation Effects in a 4-Mb SRAM With Dual Supply Voltages

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP