Impact of threshold voltage fluctuation due to random telegraph noise on scaled-down SRAM-Reference-Cited by-同舟云学术

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Impact of threshold voltage fluctuation due to random telegraph noise on scaled-down SRAM

Published:2008-04 Issue: Volume: Page:
ISSN:
Container-title:2008 IEEE International Reliability Physics Symposium
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Author:

Naoki Tega ,Hiroshi Miki ,Masanao Yamaoka ,Hitoshi Kume ,Toshiyuki Mine ,Takeshi Ishida ,Yuki Mori ,Renichi Yamada ,Kazuyoshi Torii

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/4550747/4558854/04558943.pdf?arnumber=4558943

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