Growth and scaling of oxide conduction after breakdown-Reference-Cited by-同舟云学术

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Growth and scaling of oxide conduction after breakdown

Published: Issue: Volume: Page:
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Container-title:2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual.
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Author:

Linder B.P.,Stathis J.H.,Frank D.J.,Lombardo S.,Vayshenker A.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/8520/26927/01197781.pdf?arnumber=1197781

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