PABAM: A Physics-Based Analytical Model to Estimate Bipolar Amplification Effect Induced Collected Charge at Circuit Level-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

PABAM: A Physics-Based Analytical Model to Estimate Bipolar Amplification Effect Induced Collected Charge at Circuit Level

Published:2015-12 Issue:4 Volume:15 Page:595-603
ISSN:1530-4388
Container-title:IEEE Transactions on Device and Materials Reliability
language:
Short-container-title:IEEE Trans. Device Mater. Relib.

Author:

Ruiqiang Song,Shuming Chen,Yankang Du,Pengcheng Huang,Jianjun Chen,Yaqing Chi

Funder

National Natural Science Foundation of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/7298/7339738/07297827.pdf?arnumber=7297827

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Heavy ion-induced microdose effects on the reliability of planar and FinFET-based SRAM physical unclonable functions;Applied Physics Letters;2024-06-24

2. Machine Learning-Based Soft-Error-Rate Evaluation for Large-Scale Integrated Circuits;Electronics;2023-12-12

3. An Analytical Model to Evaluate Well-Potential Modulation and Bipolar Amplification Effects;IEEE Transactions on Nuclear Science;2023-08

4. TAISAM: A Transistor Array-Based Test Method for Characterizing Heavy Ion-Induced Sensitive Areas in Semiconductor Materials;Electronics;2022-06-29

5. Current mirror featuring DTMOS for analog single‐event transient mitigation in space application;Semiconductor Science and Technology;2020-07-17

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP