Author:
Lim Jun Yeong,Moon Pyung,Lee Sang Myung,Noh Keum-Whan,Youn Tae-Un,Kim Jong-Wook,Yun Ilgu
Funder
SK Hynix and IC Design Education Center
Institute of BioMed IT, Energy IT and Smart IT Technology (BEST)
Brain Korea 21 Plus Program
Yonsei University
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials
Cited by
3 articles.
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