Author:
Pastuovic Zeljko,Jaksic Milko,Kalinka Gabor,Novak Mihaly,Simon Aliz
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
17 articles.
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1. Bias-dependent displacement damage effects in a silicon avalanche photodiode;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2021-11
2. High-resolution Rutherford backscattering spectrometry with an optimised solid-state detector;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2021-01
3. Single-stage quintuplet for upgrading triplet based lens system: Simulation for Atomki microprobe;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2017-08
4. Vacancy-related defects in n -type Si implanted with a rarefied microbeam of accelerated heavy ions in the MeV range;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2016-04
5. Sub-Micron Resolution of Localized Ion Beam Induced Charge Reduction in Silicon Detectors Damaged by Heavy Ions;IEEE Transactions on Nuclear Science;2015-12