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High-resolution Rutherford backscattering spectrometry with an optimised solid-state detector

  • Published:2021-01 Issue: Volume:487 Page:1-7
  • ISSN:0168-583X
  • Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
  • language:en
  • Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Robson S.G.ORCID,Jakob A.M.,Holmes D.ORCID,Lim S.Q.ORCID,Johnson B.C.,Jamieson D.N.

Funder

International Atomic Energy Agency

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference61 articles.

1. Backscattering Spectrometry;Chu,1978

2. Ion Beams in Materials Processing and Analysis, Vol. 9783211993;Schmidt,2013

3. Rutherford backscattering spectroscopy;Kimura,2006

4. Monolayer resolution in medium-energy ion-scattering experiments on the NiSi2(111) surface;Vrijmoeth;Phys. Rev. Lett.,1991

5. A high-resolution electrostatic spectrometer for the investigation of near-surface layers in solids by high-resolution rutherford backscattering with MeV ions;Enders;Nucl. Instrum. Methods Phys. Res. B,1992

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3. A review of uranium-based thin films;Advances in Physics;2022-10-02

4. Isotopic enrichment of silicon by high fluence 28Si− ion implantation;Physical Review Materials;2021-01-08
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