A high-resolution electrostatic spectrometer for the investigation of near-surface layers in solids by high-resolution Rutherford backscattering with MeV ions-Reference-Cited by-同舟云学术

A high-resolution electrostatic spectrometer for the investigation of near-surface layers in solids by high-resolution Rutherford backscattering with MeV ions

Published:1992-02 Issue:1-4 Volume:64 Page:817-824
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Enders Th.,Rilli M.,Carstanjen H.D.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference18 articles.

1. Backscattering Spectrometry;Chu,1978

2. Optimization and application of glancing angle Rutherford backscattering spectrometry

3. Surface analysis by charged particle spectroscopy

4. Channeling;Bøgh,1973

5. Proc. 2nd Int. Conf. on Ion Beam Surface Layer Analysis;Hirvonen,1976

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