Analysis of the Performance of Different Packaging Technologies of SiC Power Modules during Power Cycling Test
Author:
Affiliation:
1. KTH Royal Institute of Technology,Stockholm,Sweden
2. University of Warwick Coventry,UK
3. Research Institutes of Sweden,Stockholm,Sweden
Funder
Scan
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10325669/10325677/10325878.pdf?arnumber=10325878
Reference13 articles.
1. Modelling the Lifetime of Heavy Wire-bonds in Power Devices – Concepts, Limitations and Challenges
2. Reliability of thick Al wire bonds in IGBT modules for traction motor drives
3. Reliability model for Al wire bonds subjected to heel crack failures
4. Determination of Rate- and Temperature Dependent Inelastic Material Data for Sintered Silver Die Attach and Simulative Implementation
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1. Review on Power Cycling Reliability of SiC Power Device;Electronic Materials;2024-06-10
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