A Study of JEDEC Board-Level Drop Test Performance Prediction Trend of BGA Package with SAC1205 Under Different Key Factors

Author:

Cheng Chi-Min1,Chao Hsi-Wei1,Yen Chu-Chiao1,Chiang Kun-Ting1,Chang Wei-Yao1,Chang Chia-Wen1,Chen Ya-Ping1,Ho Hsien-Wei1,Ko Chun-Yu1,Kuo Chun-Liang1

Affiliation:

1. Reliability Laboratory / Advanced Semiconductor Engineering Inc. 26 Chin 3rd Rd., Nantze Export Processing Zone,Nantze,Kaohsiung,811

Publisher

IEEE

Reference6 articles.

1. Drop impact test - mechanics & physics of failure

2. Drop Impact Reliability ¿ A Comprehensive Summary

3. A study on the correlation between experiment and simulation board level drop test for SSD;kang;2017 18th International Conference on Thermal Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE),2017

4. Drop Impact Reliability Testing for Lead-Free and Leaded Soldered IC Packages

5. Weibull Analysis Handbook

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