Pulsed-Laser Testing to Quantitatively Evaluate Latchup Sensitivity in Mixed-Signal ASICs-Reference-Cited by-同舟云学术

Pulsed-Laser Testing to Quantitatively Evaluate Latchup Sensitivity in Mixed-Signal ASICs

Published:2021 Issue: Volume: Page:1-1
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Hales Joel M.,Khachatrian Ani,Ildefonso Adrian,Buchner Stephen,Adams Dennis,Wheeler David,Messenger Scott,Mishler Codie,Budzinski Nicholas,Jordan Scott,Van Art Roger,McMorrow Dale

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx7/23/4689328/09620067.pdf?arnumber=9620067

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