Advanced Compact Modeling for Transistor Aging: Trap-based Approaches and Mixed-mode Coupling-Reference-Cited by-同舟云学术

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Advanced Compact Modeling for Transistor Aging: Trap-based Approaches and Mixed-mode Coupling

Published:2023-03-07 Issue: Volume: Page:
ISSN:
Container-title:2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
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Author:

Wang Runsheng¹,Sun Zixuan¹,Li Yu²,Xue Yongkang³,Wang Zirui¹,Ren Pengpeng³,Ji Zhigang³,Zhang Lining²,Huang Ru¹

Affiliation:

1. School of Integrated Circuits, Peking University,Beijing,China

2. School of Electronic and Computer Engineering, Peking University,Shenzhen,China

3. Shanghai Jiao Tong University,Departure of Micro/Nano Electronics,Shanghai,China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10102927/10102928/10103061.pdf?arnumber=10103061

Reference23 articles.

1. A Dynamic Time Evolution Method for Concurrent Device-Circuit Aging Simulations

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Characterization and genome-informatic analysis of a novel lytic Pseudomonas mendocina phage vB_PmeS_STP12 suitable for phage therapy or biocontrol;Molecular Biology Reports;2024-03-14

2. The Understanding and Compact Modeling of Reliability in Modern Metal–Oxide–Semiconductor Field-Effect Transistors: From Single-Mode to Mixed-Mode Mechanisms;Micromachines;2024-01-12

3. A Device-Circuit Aging Simulation Framework Integrating Trap-Based Models and Sensitivity Analysis for FinFET Technology;IEEE Transactions on Electron Devices;2024-01

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