Enhancing test effectiveness for analog circuits using synthesized measurements-Reference-Cited by-同舟云学术

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Enhancing test effectiveness for analog circuits using synthesized measurements

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Container-title:Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231)
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Author:

Variyam P.N.,Chatterjee A.

Publisher

IEEE Comput. Soc

Link

http://xplorestaging.ieee.org/ielx4/5496/14777/00670860.pdf?arnumber=670860

Cited by 38 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Towards a Machine Learning Based Method for Indirect Test Generation of Mixed-Signal Circuits;2023 36th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI);2023-08-28

2. Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit;Journal of Electronic Testing;2021-03-06

3. Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits;Journal of Electronic Testing;2020-04

4. Assessing AMS-RF Test Quality by Defect Simulation;IEEE Transactions on Device and Materials Reliability;2019-03

5. Mixed-signal test automation: Are we there yet?;2018 IEEE International Symposium on Circuits and Systems (ISCAS);2018-05

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