Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits-Reference-Cited by-同舟云学术

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Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits

Published:2020-04 Issue:2 Volume:36 Page:189-203
ISSN:0923-8174
Container-title:Journal of Electronic Testing
language:en
Short-container-title:J Electron Test

Author:

El Badawi H.,Azais Florence,Bernard S.,Comte M.,Kerzerho V.,Lefevre F.

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Link

http://link.springer.com/content/pdf/10.1007/s10836-020-05868-3.pdf

Reference25 articles.

1. Abdallah L et al (2010) Sensors for built-in alternate RF test. Proc. IEEE European Test Symposium (ETS), pp 49–54

2. Ayari H et al. (2012) Smart selection of indirect parameters for DC-based alternate RF IC testing. Proc. IEEE VLSI Test Symposium (VTS), pp. 19–24

3. Ayari H et al. (2012) Making predictive analog/RF alternate test strategy independent of training set size. Proc. IEEE International Test Conference (ITC), p.9

4. Barragan MJ, Leger G (2013) Efficient selection of signatures for analog/RF alternate test. Proc. European Test Symposium (ETS), p.6

5. Barragan MJ, Leger G (2015) A procedure for alternate test feature design and selection. IEEE Design Test 32(1):18–25

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3. Transfer Learning for Test Time Reduction of Parameter Extraction in MEMS Accelerometers;Journal of Microelectromechanical Systems;2021-06

4. Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit;Journal of Electronic Testing;2021-03-06

5. A Methodology for Identification of Internal Nets for Improving Fault Coverage in Analog and Mixed Signal Circuits;Journal of Electronic Testing;2020-12

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