Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Reference23 articles.
1. Abdallah L, Stratigopoulos H, Kelma C, Mir S (2010) “Sensors for built-in alternate RF test”, Proc. IEEE European Test Symposium (ETS), pp. 49–54.
2. Ayari H, Azais F, Bernard S, Comte M, Kerzerho V, Potin O, Renovell M (2012) “Making predictive analog/RF alternate test strategy independent of training set size”, Proc. IEEE International Test Conference. (ITC), p. 9
3. Ayari H, Azais F, Bernard S, Comte M, Renovell M, Kerzerho V, Potin O, Kelma C (2012) “Smart selection of indirect parameters for DC based alternate RF IC testing”, Proc. IEEE VLSI Test Symposium (VTS), pp. 19–24
4. Badawi El H, Azais F, Bernard S, Comte M, Kerzerho V, Lefevre F, Gorenflot I (2020) “Implementing indirect test of RF circuits without compromising test quality: a practical case study”, Proc. IEEE Latin-American Test Symposium (LATS), pp. 1–6
5. Barragan MJ, Fiorelli R, Leger G, Rueda A, Huertas JL (2011) “Improving the Accuracy of RF Alternate Test Using Multi-VDD Conditions: Application to Envelope-Based Test of LNAs”, Proc. IEEE Asian Test Symposium (ATS), pp. 359–364
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献