Highly Reliable Inference System of Neural Networks Using Gated Schottky Diodes-Reference-Cited by-同舟云学术

Highly Reliable Inference System of Neural Networks Using Gated Schottky Diodes

Published:2019 Issue: Volume:7 Page:522-528
ISSN:2168-6734
Container-title:IEEE Journal of the Electron Devices Society
language:
Short-container-title:IEEE J. Electron Devices Soc.

Author:

Lim Suhwan^ORCID,Kwon Dongseok^ORCID,Eum Jai-Ho^ORCID,Lee Sung-Tae^ORCID,Bae Jong-Ho^ORCID,Kim Hyeongsu^ORCID,Kim Chul-Heung^ORCID,Park Byung-Gook^ORCID,Lee Jong-Ho^ORCID

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials,Biotechnology

Link

http://xplorestaging.ieee.org/ielx7/6245494/8656606/08698892.pdf?arnumber=8698892

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