Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
23 articles.
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1. Evaluating the Yield of Repairable SRAMs for ATE;IEEE Transactions on Instrumentation and Measurement;2006-10
2. LSI yield modeling and process monitoring;IBM Journal of Research and Development;2000-01
3. Improved yield models for fault-tolerant memory chips;IEEE Transactions on Computers;1993-07
4. Mathematical Models in Integrated-Circuit Manufacturing: A Review;Perspectives in Operations Management;1993
5. Yield Models - Comparative Study;Defect and Fault Tolerance in VLSI Systems;1990