Author:
Ottavi M.,Schiano L.,Wang X.,Kim Y.-B.,Meyer F.J.,Lombardi F.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation
Cited by
4 articles.
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2. A Simplified Yield Model for SRAM Repair in Advanced Technology;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2018-11
3. Architecture-Aware Analytical Yield Model for Read Access in Static Random Access Memory;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2015-04
4. Fault-Tolerant Embedded-Memory Strategy for Baseband Signal Processing Systems;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2013-07