A Probability Soft-Error Model for a 28-nm SRAM-based FPGA under Neutron Radiation Exposure-Reference-Cited by-同舟云学术

A Probability Soft-Error Model for a 28-nm SRAM-based FPGA under Neutron Radiation Exposure

Published:2023-04-17 Issue: Volume: Page:
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Container-title:2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
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Author:

Thieu Gia Bao¹,Schmechel Johannes¹,Weide-Zaage Kirsten²,Schmidt Katharina³,Hagenah Dorian³,Payá-Vayá Guillermo¹

Affiliation:

1. Technische Universität Braunschweig,Chair for Chip Design for Embedded Computing,Braunschweig,Germany

2. Leibniz Universität Hannover,RESRI Group, Institute of Microelectronic Systems (IMS),Hannover,Germany

3. Bundeswehr Research Institute for Protective Technologies and CBRN Protection (WIS),Munster,Germany

Publisher

IEEE

Link

Reference5 articles.

3. SRAM Test Chip for Radiation Experiment;weißbrich;Pan Pacific Symposium 2022,2022

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1. Characterization of Soft Errors on a 28-nm SRAM-based FPGA under Neutron Radiation Exposure;2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE);2024-04-07

2. Simulation of Different SRAM Cells under Neutron Radiation with GEANT4;2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE);2024-04-07

3. Radiation Tolerant Reconfigurable Hardware Architecture Design Methodology;Applied Reconfigurable Computing. Architectures, Tools, and Applications;2023