Characterization of Soft Errors on a 28-nm SRAM-based FPGA under Neutron Radiation Exposure-Reference-Cited by-同舟云学术

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Characterization of Soft Errors on a 28-nm SRAM-based FPGA under Neutron Radiation Exposure

Published:2024-04-07 Issue: Volume: Page:1-5
ISSN:
Container-title:2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
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Author:

Trumann Eike¹,Thieu Gia Bao¹,Schmechel Johannes¹,Weide-Zaage Kirsten²,Wolff Dorian von³,Bausen Andre³,Müller Alexander³,Payá-Vayá Guillermo¹

Affiliation:

1. Technische Universität Braunschweig,Chair for Chip Design for Embedded Computing,Braunschweig,Germany

2. Institute of Microelectronic Systems (IMS), Leibniz Universität Hannover,RESRI Group,Hannover,Germany

3. Bundeswehr Research Institute for Protective Technologies and CBRN Protection (WIS),Munster,Germany

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10491281/10491408/10491535.pdf?arnumber=10491535

Reference5 articles.

1. A Probability Soft-Error Model for a 28-nm SRAM-based FPGA under Neutron Radiation Exposure

2. Analyzing Radiation-Induced Transient Errors on SRAM-Based FPGAs by Propagation of Broadening Effect

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