QuFI: a Quantum Fault Injector to Measure the Reliability of Qubits and Quantum Circuits-Reference-Cited by-同舟云学术

QuFI: a Quantum Fault Injector to Measure the Reliability of Qubits and Quantum Circuits

Published:2022-06 Issue: Volume: Page:
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Container-title:2022 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)
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Author:

Oliveira Daniel¹,Giusto Edoardo²,Dri Emanuele²,Casciola Nadir²,Baheri Betis³,Guan Qiang³,Montrucchio Bartolomeo²,Rech Paolo⁴

Affiliation:

1. Federal University of Paraná (UFPR),Department of Informatics,Curitiba,Brazil

2. Politecnico di Torino,DAUIN,Torino,Italy

3. Kent State University,Department of Computer Science,Kent,USA

4. Università di Trento,Department of Industrial Engineering,Italy

Publisher

IEEE

Link

Reference41 articles.

3. Instruments for mev irradiation from ev to mev;foulliat,0

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