Understanding the Effect of Transpilation in the Reliability of Quantum Circuits
Author:
Affiliation:
1. DAUIN, Politecnico di Torino,Italy
2. Kent State University,US
3. University of Trento,Italy
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10313590/10313594/10313838.pdf?arnumber=10313838
Reference16 articles.
1. Understanding the Impact of Cutting in Quantum Circuits Reliability to Transient Faults
2. A systematic methodology to compute the quantum vulnerability factors for quantum circuits;oliveira;ArXiv Preprint,2021
3. DECOHERENCE AND DEPHASING IN SPIN-BASED SOLID STATE QUANTUM COMPUTERS
4. Efficient learning of quantum noise
5. Minimizing quasiparticle generation from stray infrared light in superconducting quantum circuits
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