Understanding the Impact of Cutting in Quantum Circuits Reliability to Transient Faults
Author:
Affiliation:
1. DAUIN, Politecnico di Torino,Torino,Italy
2. Federal University of Paraná (UFPR),Department of Informatics,Curitiba,Brazil
3. Università di Trento,Department of Industrial Engineering,Italy
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9897157/9897171/09897308.pdf?arnumber=9897308
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