High-resolution electron microscopy: from imaging toward measuring-Reference-Cited by-同舟云学术

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High-resolution electron microscopy: from imaging toward measuring

Published:2002-08 Issue:4 Volume:51 Page:611-615
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:en
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Van Aert S.,den Dekker A.J.,van den Bos A.,Van Dyck D.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx5/19/22392/01044669.pdf?arnumber=1044669

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Notes and References;Principles of Electron Optics, Volume 3;2022

3. Optimal experiment design for nanoparticle atom counting from ADF STEM images;Quantitative Atomic-Resolution Electron Microscopy;2021

4. Introduction;Quantitative Atomic-Resolution Electron Microscopy;2021

5. Model-Based Electron Microscopy;Springer Handbook of Microscopy;2019

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