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Springer International Publishing
Reference98 articles.
1. D. Zanchet, B.D. Hall, D. Ugarte: X-ray characterization of nanoparticles. In: Characterization of Nanophase Materials, ed. by Z.L. Wang (Wiley, Weinheim 2001) pp. 13–36
2. J.C.H. Spence: The future of atomic resolution electron microscopy for materials science, Mater. Sci. Eng. 26(1/2), 1–49 (1999)
3. R. Henderson: The potential and limitations of neutrons, electrons and x-rays for atomic resolution microscopy of unstained biological molecules, Q. Rev. Biophys. 28, 171–193 (1995)
4. J.P. Locquet, J. Perret, J. Fompeyrine, E. Machler, J.W. Seo, G. Van Tendeloo: Doubling the critical temperature of La1.9Sr0.1CuO4, Nature 394, 453–456 (1998)
5. D.A. Muller, M.J. Mills: Electron microscopy: Probing the atomic structure and chemistry of grain boundaries, interfaces and defects, Mater. Sci. Eng. A 260, 12–28 (1999)
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