Affiliation:
1. School of Materials Science and Engineering, Xiangtan University, Xiangtan, Hunan 411105, China
Abstract
Scanning transmission electron microscopy (STEM) developed into a very important characterization tool for atomic analysis of crystalline specimens. High-angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) has become one of the most powerful tools to visualize material structures at atomic resolution. However, the parameter of electron microscope and sample thickness is the important influence factors on HAADF-STEM imaging. The effect of convergence angle, spherical aberration, and defocus to HAADF imaging process has been analyzed through simulation. The applicability of two HAADF simulation software has been compared, and suggestions for their usage have been given.
Funder
Natural Science Foundation of Hunan Province
Subject
Instrumentation,Atomic and Molecular Physics, and Optics
Cited by
1 articles.
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