A novel SEU injection setup for Automotive SoC
Author:
Affiliation:
1. Politecnico di Torino,Italy
2. STMicroelectronics,Italy
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9831187/9831454/09831533.pdf?arnumber=9831533
Reference9 articles.
1. Single Event Upset: An Embedded Tutorial
2. Detection System of Single Event Upset Based on FPGA
3. Analysis of radiation-induced SEU s on dynamic reconfigurable systems;sterpone;Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC) 2016 11th International Symposium on,0
4. Industrial best practice: cases of study by automotive chip- makers
5. Single-event-upset-like fault injection: a comprehensive framework
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1. A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip;2022 IEEE 23rd Latin American Test Symposium (LATS);2022-09-05
2. In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip;2022 IEEE International Test Conference (ITC);2022-09
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