Author:
Abbati L. Degli,Ullmann R.,Paganini G.,Coppetta M.,Zaia L.,Huard V.,Montfort O.,Cantoro R.,Insinga G.,Venini F.,Calao P.,Bernardi P.
Funder
Center for Automotive Research and Sustainable mobility@PoliTO
Cited by
3 articles.
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1. A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test;2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC);2023-10-16
2. Recent Trends and Perspectives on Defect-Oriented Testing;2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS);2022-09-12
3. A novel SEU injection setup for Automotive SoC;2022 IEEE 31st International Symposium on Industrial Electronics (ISIE);2022-06-01