A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip
Author:
Affiliation:
1. Politecnico di Torino,Italy
2. ST Microelectronics,Italy
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9936897/9936898/09936975.pdf?arnumber=9936975
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1. Parallel test reduces cost of test more effectively than just a cheap tester
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5. Reliability engineering theory and practice;birolini;Springer,2017
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