Dielectric Aspects of Prebreakdown Phenomena in Insulators
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,General Engineering
Link
http://xplorestaging.ieee.org/ielx5/14/4080682/04080686.pdf?arnumber=4080686
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Study of microstructural changes in silicon single crystals subject to high electric fields by using a high resolution X-ray diffraction method;Physica Status Solidi (a);1983-12-16
2. STRUCTURAL CHANGES IN CRYSTALS AT POWER DENSITIES NEAR THE ELECTRIC BREAKDOWN;Synthesis, Crystal Growth and Characterization;1982
3. High resolution x-ray study of microstructural changes in semiconductors and insulators subject to high electric fields;Solid State Communications;1981-11
4. A Diagnostic for the Condition of Dielectrics;IEEE Transactions on Electrical Insulation;1981-10
5. Absolute calorimetric determination of dielectric loss factors at w = 104 s-1 and 4.2 k and application to the measurement of loss factors of standard capacitors at room temperature;IEEE Transactions on Instrumentation and Measurement;1980-12
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