Study of microstructural changes in silicon single crystals subject to high electric fields by using a high resolution X-ray diffraction method
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference19 articles.
1. Ein r�ntgenographischer Nachweis der elektrischen Polarisation eines Kristallgitters
2. The Effect of a Direct Electric Field on the Laue Diffraction Photograms
3. The Effect of Piezoelectric Oscillation on the Intensity of X-ray Reflections from Quartz
4. Der Einfluß starker elektrischer Felder auf Intensität und Lage der Bragg-Reflexe / The Influence of Strong Electrical Fields on Intensities and Positions of Bragg-Reflections
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Experimental evaluation of on-chip measurement of charge transfer by X-rays;Electronics Letters;2000
2. Space-Charge Polarisation and X-Ray Diffraction Extinction Reduction in Synthetic and Natural Quartz Crystals;physica status solidi (b);1994-12-01
3. High resolution X-ray diffraction studies of real structure of nearly perfect single crystals;Bulletin of Materials Science;1993-12
4. X-ray diffraction study of crystals under a static electric field;Progress in Crystal Growth and Characterization of Materials;1993-01
5. X-ray diffraction study of lithium hydrazinium sulfate and lithium ammonium sulfate crystals under a static electric field;Journal of Applied Crystallography;1991-12-01
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