High resolution x-ray study of microstructural changes in semiconductors and insulators subject to high electric fields
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Condensed Matter Physics,General Chemistry
Reference6 articles.
1. Dielectric Aspects of Prebreakdown Phenomena in Insulators
2. Instabilities during high‐field electrical conduction in solids
3. Thermal instability—The precursor to switching in inhomogeneous thin films
4. High resolution experimental techniques of measurement of diffuse X-ray scattering from single crystals
5. High-resolution diffuse X-ray scattering study from nearly perfect silicon single crystals
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