High resolution experimental techniques of measurement of diffuse X-ray scattering from single crystals
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Condensed Matter Physics,General Chemistry
Reference16 articles.
1. Determination of elastic constants of crystals from diffuse reflexions of X-rays. II. Application to some cubic crystals
2. Diffuse X-ray Reflections from Crystals;Wooster,1962
3. Elastic constants of orthorhombic KNbO3by X-ray diffuse scattering
4. Approximate Elastic Spectrum of β‐Brass from X‐Ray Scattering
Cited by 16 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. High resolution X-ray diffraction studies of real structure of nearly perfect single crystals;Bulletin of Materials Science;1993-12
2. A high-resolution diffuse X-ray scattering study of defects in dislocation-free silicon crystals grown by the float-zone method and comparison with Czochralski-grown crystals;Journal of Applied Crystallography;1989-06-01
3. X-ray scattering from point defect aggregates in single crystals;Progress in Crystal Growth and Characterization;1989-01
4. High resolution X-ray diffraction study of defect structures produced by high d.c. electric fields in silicon single crystals;Materials Science and Engineering;1987-01
5. High-resolution diffuse X-ray scattering studies of silicon single crystals grown by float zone method;Acta Crystallographica Section A Foundations of Crystallography;1984-08-09
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