Address and data scrambling: causes and impact on memory tests

Author:

van de Goor A.J.,Schanstra I.

Publisher

IEEE Comput. Soc

Cited by 42 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

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2. Read Disturbance in High Bandwidth Memory: A Detailed Experimental Study on HBM2 DRAM Chips;2024 54th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN);2024-06-24

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5. Innovation Methodology for Foundry Array De-Scrambling Logical to Physical (L2P) Mapping;2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA);2023-07-24

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