Author:
Wu Lizhou,Taouil Mottaqiallah,Rao Siddharth,Marinissen Erik Jan,Hamdioui Said
Cited by
17 articles.
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1. MBIST-based weak bit screening method for embedded MRAM;2024 IEEE European Test Symposium (ETS);2024-05-20
2. Design-for-Test for Intermittent Faults in STT-MRAMs;2024 IEEE European Test Symposium (ETS);2024-05-20
3. Multi-Level Reference for Test Coverage Enhancement of Resistive-Based NVM;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22
4. Device-Aware Diagnosis for Yield Learning in RRAMs;2024 Design, Automation & Test in Europe Conference & Exhibition (DATE);2024-03-25
5. Characterization and Test of Intermittent Over RESET in RRAMs;2023 IEEE 32nd Asian Test Symposium (ATS);2023-10-14