Author:
Huang Shi-Yu,Huang Li-Ren,Tsai Kun-Han,Cheng Wu-Tung
Cited by
7 articles.
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1. A High-Precision Delay Faults Testing Technique Based on the Improved DWR Structure;2023 8th International Conference on Integrated Circuits and Microsystems (ICICM);2023-10-20
2. ExTest Scheduling and Optimization;Testing of Interposer-Based 2.5D Integrated Circuits;2017
3. Post-bond Scan-Based Testing of Interposer Interconnects;Testing of Interposer-Based 2.5D Integrated Circuits;2017
4. Introduction;Testing of Interposer-Based 2.5D Integrated Circuits;2017
5. Built-In Self-Test and Test Scheduling for Interposer-Based 2.5D IC;ACM Transactions on Design Automation of Electronic Systems;2015-09-28