A fast and accurate per-cell dynamic IR-drop estimation method for at-speed scan test pattern validation

Author:

Yamato Yuta,Yoneda Tomokazu,Hatayama Kazumi,Inoue Michiko

Publisher

IEEE

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Routability-driven Power/Ground Network Optimization Based on Machine Learning;ACM Transactions on Design Automation of Electronic Systems;2023-05-17

2. Vector-based Dynamic IR-drop Prediction Using Machine Learning;2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC);2022-01-17

3. Fast IR drop estimation with machine learning;Proceedings of the 39th International Conference on Computer-Aided Design;2020-11-02

4. Machine-learning-based dynamic IR drop prediction for ECO;Proceedings of the International Conference on Computer-Aided Design;2018-11-05

5. DART—A Concept of In-field Testing for Enhancing System Dependability;VLSI Design and Test for Systems Dependability;2018-07-21

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