Investigating Substrate Loss in MEMS Acoustic Resonators and On-Chip Inductors
Author:
Affiliation:
1. Department of Electrical and Computing Engineering, University of Illinois at Urbana–Champaign, Urbana, IL, USA
2. Department of Electronic and Computer Engineering, The Hong Kong University of Science and Technology, Hong Kong
Funder
NSF Spectrum Efficiency, Energy Efficiency, and Security (SpecEES) Program
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Acoustics and Ultrasonics,Instrumentation
Link
http://xplorestaging.ieee.org/ielx7/58/9782472/09759416.pdf?arnumber=9759416
Reference31 articles.
1. Small- and large-signal characterization of trap-rich HR-Si/HR-SOI wafers for SoC applications;neve,2012
2. A practical guide for accurate broadband on-wafer calibration in RF silicon applications;rumiantsev;Proc 1st Int MOS-AK Meeting,2008
3. Toward Ka Band Acoustics: Lithium Niobate Asymmetrical Mode Piezoelectric MEMS Resonators
4. 10–60-GHz Electromechanical Resonators Using Thin-Film Lithium Niobate
5. Scaling Acoustic Filters Towards 5G
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