A 12-bit 10GS/s 16-Channel Time-Interleaved ADC with a Digital Processing Timing-Skew Background Calibration in 5nm FinFET

Author:

Moon Kyoung-Jun1,Oh Dong-Ryeol1,Park Young-Hyo1,Lee Kyung-Hoon1,Park Sun-Jae1,Lee Sung-No1,Hwang Hee-Chang1,Shin Hyo-Chul1,Cho Young-Jae1,Choi Michael1,Shin Jong-Shin1

Affiliation:

1. Samsung Electronics,Hwaseong-City,South Korea

Publisher

IEEE

Reference6 articles.

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. A comprehensive review of time skew background calibration and mitigation techniques in high‐speed time‐interleaved analog‐to‐digital converters;International Journal of Circuit Theory and Applications;2024-06-12

2. A Power-Efficient Clock Circuit and Output Serializing Technique Integrated in a 12-bit 10-GS/s ADC;IEEE Transactions on Circuits and Systems I: Regular Papers;2024-04

3. 22.1 A 12GS/s 12b 4× Time-Interleaved Pipelined ADC with Comprehensive Calibration of TI Errors and Linearized Input Buffer;2024 IEEE International Solid-State Circuits Conference (ISSCC);2024-02-18

4. A 4.8 GS/s 11b Time-Interleaved TDC-Assisted SAR ADC with High-Speed Latch-based VTC;ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC);2023-09-11

5. A 12/16 GSps Time-Interleaved Pipelined-SAR ADC with Temperature Robust Performance at 0.75V Supply in 7nm FinFET Technology;ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC);2023-09-11

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