Reliable Binarized Neural Networks on Unreliable Beyond Von-Neumann Architecture-Reference-Cited by-同舟云学术

Reliable Binarized Neural Networks on Unreliable Beyond Von-Neumann Architecture

Author:

Yayla Mikail¹^ORCID,Thomann Simon²,Buschjager Sebastian³^ORCID,Morik Katharina³^ORCID,Chen Jian-Jia¹^ORCID,Amrouch Hussam²^ORCID

Affiliation:

1. Design Automation for Embedded Systems Group, TU Dortmund University, Dortmund, Germany

2. Chair for Semiconductor Test and Reliability (STAR), University of Stuttgart, Stuttgart, Germany

3. Artificial Intelligence Group, TU Dortmund University, Dortmund, Germany

Funder

Collaborative Research Center SFB 876 “Providing information by resource-constrained analysis”

German Competence Center for Machine Learning Rhine Ruhr

German Federal Ministry for Education and Research

Deutsche Forschungsgemeinschaft (DFG) Project OneMemory

DFG Project ACCROSS

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture

Link

Reference31 articles.

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