The True Cost of Errors in Emerging Memory Devices: A Worst-Case Analysis of Device Errors in IMC for Safety-Critical Applications-Reference-Cited by-同舟云学术

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The True Cost of Errors in Emerging Memory Devices: A Worst-Case Analysis of Device Errors in IMC for Safety-Critical Applications

Published:2023-07-03 Issue: Volume: Page:
ISSN:
Container-title:2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)
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Author:

Vardar Alptekin¹,Zhang Li²,Jain Saiyam Bherulal²,Mojumder Shaown¹,Laleni Nellie¹,De Sourav¹,Kämpfe Thomas¹

Affiliation:

1. Fraunhofer IPMS,Dresden,Germany

2. TU Dresden,Germany

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10192100/10192102/10192126.pdf?arnumber=10192126

Reference15 articles.

1. Reliable Binarized Neural Networks on Unreliable Beyond Von-Neumann Architecture

2. Impact of process variations on emerging memristor

3. Endurance and targeted programming behavior of HfO2-FeFETs

4. Bit-Flip Attack: Crushing Neural Network With Progressive Bit Search

5. A Ferroelectric FET Based In-memory Architecture for Multi-Precision Neural Networks

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Adaptive Mixed MLC-SLC FeFET Mapping for CIM AI Applications Through Simulated Annealing;2024 IEEE 6th International Conference on AI Circuits and Systems (AICAS);2024-04-22

2. Fixed charges at the HfO2/SiO2 interface: Impact on the memory window of FeFET;Memories - Materials, Devices, Circuits and Systems;2023-07

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