Author:
Niu Dimin,Chen Yiran,Xu Cong,Xie Yuan
Cited by
35 articles.
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1. The study of lithographic variation in resistive random access memory;Journal of Semiconductors;2024-05-01
2. Device-Aware Diagnosis for Yield Learning in RRAMs;2024 Design, Automation & Test in Europe Conference & Exhibition (DATE);2024-03-25
3. CorrectNet+: Dealing With HW Non-Idealities in In-Memory-Computing Platforms by Error Suppression and Compensation;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2024-02
4. Device-Aware Test for Ion Depletion Defects in RRAMs;2023 IEEE International Test Conference (ITC);2023-10-07
5. The True Cost of Errors in Emerging Memory Devices: A Worst-Case Analysis of Device Errors in IMC for Safety-Critical Applications;2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD);2023-07-03