An All-Digital, 1.92–7.32 mV/LSB, 0.5–2 GS/s Sample Rate, and 0-Latency Prediction Voltage Sensor With Dynamic PVT Calibration for Droop Detection and AVS System-Reference-Cited by-同舟云学术

An All-Digital, 1.92–7.32 mV/LSB, 0.5–2 GS/s Sample Rate, and 0-Latency Prediction Voltage Sensor With Dynamic PVT Calibration for Droop Detection and AVS System

Published:2023-12 Issue:12 Volume:70 Page:4888-4899
ISSN:1549-8328
Container-title:IEEE Transactions on Circuits and Systems I: Regular Papers
language:
Short-container-title:IEEE Trans. Circuits Syst. I

Author:

Du Yuxuan¹^ORCID,Qian Junyi¹^ORCID,Chen Zhuo¹,Shan Weiwei²^ORCID

Affiliation:

1. School of Electronic Science and Engineering, Southeast University, Nanjing, China

2. School of Integrated Circuit, Southeast University, Nanjing, China

Funder

National Key Research and Development Program of China

National Natural Science Foundation of China

Natural Science Foundation of Jiangsu Province

Fundamental Research Funds for the Central Universities

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture

Link

http://xplorestaging.ieee.org/ielx7/8919/10363413/10229936.pdf?arnumber=10229936

Reference33 articles.

1. Harnessing CPU Electromagnetic Emanations for Resonance-Induced Voltage-Noise Characterization

2. Run-Time Protection of Multi-Core Processors From Power-Noise Denial-of-Service Attacks

3. Voltage Noise in Multi-Core Processors: Empirical Characterization and Optimization Opportunities

4. 25.2 A 480mA Output-Capacitor-Free Synthesizable Digital LDO Using CMP- Triggered Oscillator and Droop Detector with 99.99% Current Efficiency, 1.3ns Response Time, and 9.8A/mm2 Current Density

5. An Output-Capacitor-Free Synthesizable Digital LDO Using CMP-Triggered Oscillator and Droop Detector

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1. 14.2 Proactive Voltage Droop Mitigation Using Dual-Proportional-Derivative Control Based on Current and Voltage Prediction Applied to a Multicore Processor in 28nm CMOS;2024 IEEE International Solid-State Circuits Conference (ISSCC);2024-02-18