Validation of Snap-Through Voltages of Electrostatically Actuated Devices with Closed Form Equations
Author:
Affiliation:
1. Saveetha Engineering College,Department of Electronics and Instrumentation,Chennai,India,602105
2. Vellore Institute of Technology Chennai Campus,School of Electrical engineering,Chennai,India
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10262404/10262827/10263013.pdf?arnumber=10263013
Reference37 articles.
1. Low insertion loss and high isolation capacitive RF MEMS switch with low pull-in voltage
2. Suppressing residual vibrations in comb-drive electrostatic actuators: A command shaping technique adapted to nomadic applications
3. Effect of Stress on Pull-in Voltage of RF MEMS SPDT Switch
4. Mechanical behavior of a rectangular capacitive micro-plate subjected to an electrostatic load
5. Closed form solutions for the pull-in voltage of micro curled beams subjected to electrostatic loads
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