Automated test equipment for research on nonvolatile memories
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation
Link
http://xplorestaging.ieee.org/ielx5/19/20793/00963177.pdf?arnumber=963177
Cited by 16 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Design of Clocked Comparator Preventing Bit Errors to Improve Reliability of Low-Speed DRAM Measurement;IEEE Transactions on Instrumentation and Measurement;2023
2. Productivity Improvement on Functional Test of Integrated Circuits Device Under High Temperature Condition;Proceedings of the International Conference on Data Engineering 2015 (DaEng-2015);2019
3. An Automated Test Equipment for Characterization of Emerging MRAM and RRAM Arrays;IEEE Transactions on Emerging Topics in Computing;2018-04-01
4. Design of an FPGA-based RRAM parameter measurement platform;2018 IEEE International Conference on Industrial Technology (ICIT);2018-02
5. Performance Evaluation of Non Volatile Memories with a Low Cost and Portable Automatic Test Equipment;Lecture Notes in Electrical Engineering;2017-06-04
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