Author:
Alieri Gineuve,Costantino Giaconia G.,Mistretta Leonardo,La Rosa Francesco,Cimino A. Angelo
Publisher
Springer International Publishing
Reference5 articles.
1. Papavramidou, P., Nicolaidis, M.: Transparent BIST for ECC-based memory repair. In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), July 8–10 (2013)
2. Bernardi, P., Ciganda, L., Reorda, M.S., Hamdioui, S.: SW-based transparent in-field memory testing. In: 16th IEEE Latin American Test Symposium, March 25–27, 2015, Puerto Vallarta, Mexico
3. Pellati, P., Olivo, P.: Automated test equipment for research on nonvolatile memories. IEEE Trans. Instrum. Meas. 50(5), 1162–1166 (2001)
4. Baderna, D., Cabrini, A., Gobbi, L., Torelli, G.: A versatile and Compact USB system for electrical and thermal characterization of non-volatile memories. In: Instrumentation and Measurement Technology Conference, Ap., pp. 1217–1220 (2006)
5. Alieri, G., Giaconia, G.C., La Rosa, F., Cimino, A.A.: Portable automatic test equipment for performance evaluation of non volatile memory. In: Proceeding of GE2016, June 22–24, Brescia, Italy (2016)