Affiliation:
1. Department of Electronics and Communications Engineering, Kwangwoon University, Seoul, South Korea
Funder
Excellent Researcher Support Project of Kwangwoon University in 2023
National Research Foundation of Korea (NRF) through Korean Government [Ministry of Science and ICT (MSIT)]
Institute of Information and Communications Technology Planning and Evaluation (IITP) through Korean Government
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation
Reference34 articles.
1. A new wafer level latent defect screening methodology for highly reliable DRAM using a response surface method;nam;Proc IEEE Int Test Conf,2008
2. An Automated Methodology for the Tracking of Electrical Performance for Memory Test Systems
3. A 32 Gb/s 0.55 mW/Gbps PAM4 1-FIR 2-IIR tap DFE receiver in 65-nm CMOS
4. A 10 Gb/s/pin DQS and WCK built-out tester for LPDDR5 DRAM test;kye;Proc IEEE Asian Solid-State Circuits Conf (A-SSCC),2022
5. An ASIC library granular DRAM macro with built-in self test