Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
34 articles.
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1. Single-Event Effects Response of 96- and 176-Layer 3D NAND Flash Memories;2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC);2023-07
2. Single Event Effects in 3-D NAND Flash Memory Cells With Replacement Gate Technology;IEEE Transactions on Nuclear Science;2023-04
3. Electrostatic Shielding of NAND Flash Memory from Ionizing Radiation;2023 IEEE International Reliability Physics Symposium (IRPS);2023-03
4. A Recovery Method of RAM Disk by using Remote Backup;The Journal of Korean Institute of Information Technology;2023-02-28
5. Single-Event Upset in 3-D Charge-Trap NAND Flash Memories;IEEE Transactions on Electron Devices;2022-11